Deals with the thermal behavior of current-carrying conductors and it embraces the time scale from microseconds to hours. Methods and data are presented to enable the continuous dynamic probabilistic and fault-current ratings to be calculated forMoreDeals with the thermal behavior of current-carrying conductors and it embraces the time scale from microseconds to hours. Methods and data are presented to enable the continuous dynamic probabilistic and fault-current ratings to be calculated for various surface and atmospheric conditions.